Design Method for Truncated Values in Testability Test Plans Based on the Degree of Discreteness
Year: 2024
Type: conference-paper
Authors: Yiqiong Zhang, Changping Yu, Weijie Peng
Language: English
Topic: Engineering and Test Systems
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407693426