Work

Aging-Aware Design Method for Reliable Analog Integrated Circuits Combining Reliability-Aware Circuit Architectures, Transistor's Threshold Voltage and Operating Point-Dependent Degradation

Year: 2024

Type: conference-paper

DOI: 10.1109/ewdts63723.2024.10873644

Authors: Vazgen Melikyan, Gurgen Grigoryan, Xuefeng Zheng, Kang Li, Shavarsh Melikyan, Tigran Grigoryan

Institutions: National Polytechnic University of Armenia, Yerevan State University, Xidian University, University of Bristol

Language: English

Topic: Analog and Mixed-Signal Circuit Design

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Key Research and Development Program of China

Award: G1676428468

OpenAlex ID: W4407693623

FWCI: 3.814

Cites: 6

Cited by: 4

Related to: 10