Work

Research and Development of a Deep Learning-Based Automated Imaging System for FIB-SEM

Year: 2024

Type: conference-paper

Source: International Forum on Electrical Engineering and Automation (IFEEA)

DOI: 10.1109/ifeea64237.2024.10878725

Authors: Mengying Wang, Ying Wang, Jianpeng Zhu, Minglai Yang, Zhenfeng Cao

Institutions: Shanghai Institute of Technology, Shanghai Jiao Tong University, Jilin Agricultural University

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W4407693834

FWCI:

Cites: 5

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Related to: 10