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Lightweight Mobile Phone Screen Flaw Detection Algorithm Based on Improved YOLOv8

Year: 2024

Type: conference-paper

Source: Global Reliability and Prognostics and Health Management Conference (PHM)

DOI: 10.1109/phm-beijing63284.2024.10874551

Authors: Wanxin CHEN, Wei ZHOU, Yuyuan ZHANG, Kaibin YAN, Lixiao MA, Pengfei HE

Institution: Yantai University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407694521

FWCI:

Cites: 7

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Related to: 10