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Test Case Generation Techniques for Fault Root Cause Localization

Year: 2024

Type: conference-paper

Source: International Conference on Signal Processing, Computer Networks and Communications (SPCNC)

DOI: 10.1145/3712335.3712357

Authors: Hao Du, Chengshan Gao, Zhaotun Ma

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407706654

FWCI: 0.277

Cites: 8

Cited by: 1

Related to: 10