Research on the variation of dark current of 5T CMOS image sensor under γ-ray irradiation
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3058999
Author: Li Ailing
Institution: Yantai Vocational College
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407731340