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An Enhanced Approach for Defect Detection: Implementing CNN Algorithm and Identifying Catastrophic Forgetting

Year: 2024

Type: conference-paper

Source: International Conference on Computer Engineering, Network, and Intelligent Multimedia (CENIM)

DOI: 10.1109/cenim64038.2024.10882821

Authors: Putu Aryasatya Dharma Kenzhie, Grace Adeline Kharisma, Henry Lucky, Meiliana

Institution: Binus University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Zero hunger

Open Access status: closed

OpenAlex ID: W4407737635

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