LaAl11.76-x-y(NixTiy)O19 (x,y=0.2-0.8) microwave dielectric ceramics exhibit τf nearly zero
Year: 2025
Type: conference-paper
Abstract: The development of mobile communication technology urgently needs microwave dielectric ceramic materials with high-temperature stability. Herein, LaAl11.76-x-y(Ni x Ti y )O19 (LANT, x,y=0.2-0.8) ceramic samples were produced using the solid-state reaction technique. The experimental results show that after sintering at 1300 °C for 2 h, the excellent microwave dielectric properties are gained at x=0.4 and y=0.6, εr=18.1, Q×f=23677 GHz, and τf=+0.15 ppm/°C. The εr and Q×f values first rise and then diminish as the amount increases x due to the change in the structural stability of the material and the symmetric tensile pattern of the Al/NiTi-O bond. It is speculated that the addition of [Ni x Ti y ]3+ increases the inclination angle of the Oxygen octahedron, and thus promotes the orientation of τf to zero. This work verifies the great potential of LANT (x,y=0.2-0.8) ceramics in improving the temperature stability of microwave devices.
Authors: Mian Jiang, Hua He, Chuyun Huang
Institution: Hubei University of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W4407768866