Multifaceted impacts of reliability issues: trap dynamics, positive bias temperature instability, and effect of temperature on the HSSP-nTFET
Year: 2025
Type: article
Authors: George Mili, Brinda Bhowmick
Institution: National Institute Of Technology Silchar
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407779096