Comparison of Residual EVMs in Modulated-signal OTA Tests using VNA- and VSA-based Approaches
Year: 2024
Type: conference-paper
Authors: Ke Li, Xiao Liu, Yichi Zhang, Xiaohai Cui
Institution: National Institute of Metrology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407786472