Work

An Analysis Method for Comparing ADC Merit in Digital and Hybrid Phased Array

Year: 2024

Type: conference-paper

Source: IEEE International Symposium on Phased Array Systems and Technology (PAST)

DOI: 10.1109/array58370.2024.10880448

Author: Ben Annino

Institution: Analog Devices (United States)

Language: English

Topic: Analog and Mixed-Signal Circuit Design

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407787446

FWCI:

Cites: 2

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Related to: 10