Work

Classification of Semiconductor Defects Using Few Shot Learning with Sythetic Minority Oversampling Technique

Year: 2024

Type: conference-paper

Source: International Conference on Mobile Networks and Wireless Communications (ICMNWC)

DOI: 10.1109/icmnwc63764.2024.10872109

Authors: Hassan Mohamed, Sowmyashree M S, K. Balageeta, Naveen I G, G. Vijayakumari

Institutions: Islamic University of Najaf, SRKR Engineering College, Nitte Meenakshi Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407787929

FWCI:

Cites: 16

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Related to: 10