Work

Defect Detection in Printed Circuit Board Manufacturing Using Part Image Classification Based Whole Image Understanding with Direct Defect Detection

Year: 2024

Type: conference-paper

Source: International Conference on Mobile Networks and Wireless Communications (ICMNWC)

DOI: 10.1109/icmnwc63764.2024.10872337

Authors: Anushree Gopalakrishnan, Haider Mohammed Abbas, Lakshita Phor, Ramachandra A C, S. Sivakami

Institutions: Kumaraguru College of Technology, Islamic University of Najaf, Chandigarh University, Nitte Meenakshi Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407787975

FWCI: 1.51

Cites: 14

Cited by: 2

Related to: 10