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Improving IoT Device Reliability Through Cold Standby Sparing Redundancy

Year: 2024

Type: conference-paper

DOI: 10.1109/smart63812.2024.10882517

Authors: Nagarjuna Putta, Ravi Laudya, Mahaveer Siddagoni Bikshapathi, Vivek Sharma, Suraj Dharmapuram, Rudramani Bhutia

Institutions: Indian Institute of Science Bangalore, Galgotias University, Koneru Lakshmaiah Education Foundation

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407788160

FWCI:

Cites: 13

Cited by:

Related to: 10