High Fault-Tolerant DNA Image Storage System Based on VAE
Year: 2025
Type: article
Authors: Yuyang Lu, Zhihao Zhang, Jing Yang, Cheng Zhang
Institutions: North China Electric Power University, Peking University
Language: English
Topic: DNA and Biological Computing
Subfield: Molecular Biology
Domain: Life Sciences
Open Access status: closed
OpenAlex ID: W4407826353
