Work

PIDDN: Pair-Image-Based Defect Detection Network With Template for PCB Inspection

Year: 2025

Type: article

Source: IEEE Transactions on Components Packaging and Manufacturing Technology

DOI: 10.1109/tcpmt.2025.3543396

Authors: Qixing Jiang, Xiaojun Wu, Jinghui Zhou, Jun Cheng

Institutions: Harbin Institute of Technology, Chinese Academy of Sciences, Shenzhen Institutes of Advanced Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G1773924491, G1907891493, G2357579100

OpenAlex ID: W4407830016

FWCI: 1.508

Cites: 39

Cited by: 3

Related to: 10