Application of new development technology to ultra-narrow pitch patterns formed by electron beam lithography
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3051148
Institution: Tokyo Electron Kyushu Ltd (Japan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407832714
