Digital lithography technology for the formation of high aspect ratio vias with side wall optimization for dry etch processes on advanced substrates
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3049448
Institution: Applied Materials (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407832839
