Die-to-prompt: visual language model-based defect inspection and anomaly detection
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3052174
Author: Yu Ding
Institution: Nvidia (United States)
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407833264