FIB/SEM for inline 3D metrology and defect analysis
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3051211
Authors: Mark Najarian, Gavin Mitchson, Pete Carleson, Ivy Wu, Laura Zhu
Institution: Thermo Fisher Scientific (United States)
Language: English
Subfield: Computational Mechanics
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407833843
