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Method for reducing false positives using pattern binning based on unsupervised learning

Year: 2025

Type: conference-paper

DOI: 10.1117/12.3048535

Authors: Minoru Harada, Takehiro Maeda, Hajime Kawano

Institutions: Hitachi (Japan), Hitachi High-Tech (Japan)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407834007

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Cites: 5

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Related to: 10