Work

Optical characterization of 2D heterostructure MoS2/WS2 using spectroscopic ellipsometry

Year: 2025

Type: article

Abstract: TMDC materials like MoS2 and WS2 are well known for their unique monolayer properties, ideal for optoelectronic applications. Stacking these monolayers enhances the properties beneficial for light detection and harvesting devices. This study investigates the dielectric function and critical point (CP) energies of heterostructure MoS2/WS2 using spectroscopic ellipsometry (SE) within the spectral range of 1.5 to 6.0 eV at different angles. The SE method, employing the Tauc-Lorentz model for detailed analysis, confirms the formation of high-quality TMDC heterostructure and provides precise values for intrinsic properties. These results are crucial for optimizing TMDC-based optoelectronic devices for military and commercial applications.

Source: Journal of Military Science and Technology

DOI: 10.54939/1859-1043.j.mst.101.2025.117-123

Authors: Hoang Tung Nguyen, Van Long Le, Thi Mai Nguyen, Xuan Khuyen Bui, Thi Giang Nguyen, Nhat Linh Nguyen

Institutions: Institute of Materials Science, Vietnam Academy of Science and Technology

Language: English

Topic: 2D Materials and Applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: diamond

OpenAlex ID: W4407860576

FWCI:

Cites: 33

Cited by:

Related to: 10