Electrically Driven Strain‐Activated Defect Emission from Hexagonal Boron Nitride at Room Temperature
Year: 2025
Type: article
Authors: Yongchen Chen, Haoyun Huang, Maowen Ge, Wenfei Li, Lan Zhang, Wei Du, Tao Wang
Institution: Soochow University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4407860965
