Work

Method for Yield Enhancement of ReRAM Memory Arrays via Reference Voltage Calibration

Year: 2024

Type: conference-paper

Source: IEEE Nanotechnology Materials and Devices Conference (NMDC)

DOI: 10.1109/nmdc58214.2024.10894221

Authors: Sherif Amer, Ahmed Emara, Hassanein H. Amer

Institutions: Schweitzer Engineering Laboratories (United States), American University in Cairo

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407938470

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Cites: 13

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Related to: 10