Work

Self-Heating Effects and Reliability Concerns in 28nm FD SOI Devices at Cryogenic Temperatures

Year: 2024

Type: conference-paper

Source: IEEE Nanotechnology Materials and Devices Conference (NMDC)

DOI: 10.1109/nmdc58214.2024.10894653

Authors: Dragica Vasileska, Ziyi Wang, Michael Povolotskyi, Gilson I. Wirth

Institutions: Arizona State University, Universidade Federal do Rio Grande do Sul

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Affordable and clean energy

Open Access status: closed

OpenAlex ID: W4407938662

FWCI: 0.781

Cites: 25

Cited by: 1

Related to: 10