Work

Intelligent Defect Detection Using Machine Learning to Improve Fabric Quality Control

Year: 2024

Type: conference-paper

Source: International Conference on System, Computation, Automation and Networking (ICSCAN)

DOI: 10.1109/icscan62807.2024.10894618

Authors: K. Anupriya, K. Sasidharan, D. Praveen Kumar, S. Chandiran

Institution: Sri Manakula Vinayagar Educational Trust

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407951209

FWCI:

Cites: 20

Cited by:

Related to: 10