Work

Enhanced On-Chip Memory Reliability for Space Engineering using a Novel 2-Dimensional Error Detection and Correction Scheme

Year: 2024

Type: conference-paper

Source: International Conference on System, Computation, Automation and Networking (ICSCAN)

DOI: 10.1109/icscan62807.2024.10893906

Authors: Jenifer Shruthi J, K. Rasadurai

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4407951248

FWCI:

Cites: 14

Cited by:

Related to: 10