Work

Bare Printed Circuit Board Defects Localization and Detection Using YOLOv5 Models

Year: 2024

Type: conference-paper

Source: International Conference on Robotics and Automation in Industry (ICRAI)

DOI: 10.1109/icrai62391.2024.10894537

Authors: Wajih Ahmed Khan, Amir Hamza, Muhammad Usman Akram, Umar Shahbaz Khan, Tahir Nawaz

Institution: National University of Sciences and Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407951303

FWCI: 0.723

Cites: 21

Cited by: 1

Related to: 10