Work

Application of Machine Learning for Anticipating Chip Failure Rates in VLSI Design

Year: 2024

Type: conference-paper

Source: International Conference on System, Computation, Automation and Networking (ICSCAN)

DOI: 10.1109/icscan62807.2024.10894575

Authors: T. Srihari, P. Umamaheswari, Seenuvasamurthi Sockkalingam, Nilesh P. Bodne, Charushila Axay Patel, S. B G Tilak Babu

Institutions: Saveetha University, SRM Institute of Science and Technology, Dr. Babasaheb Ambedkar Technological University, Gujarat Technological University, Aditya University

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4407951308

FWCI: 1.557

Cites: 8

Cited by: 2

Related to: 10