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Enhanced Cognitive Quality Inspection in Manufacturing through Siamese Few-Shot Learning

Year: 2024

Type: conference-paper

Source: IEEE Pune Section International Conference (PuneCon)

DOI: 10.1109/punecon63413.2024.10895906

Authors: Yog Dharaskar, Atharva Parikh, Ketaki Aloni, Vipulkumar Rajput

Institution: Purdue University West Lafayette

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408018654

FWCI:

Cites: 19

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Related to: 10