Comparison of black and white box model of VSC by DQ-frame admittance modeling method
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Seo-Rin Yoo, Seung-Il Moon, Gyu-Sub Lee
Institution: Seoul National University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4408023835