Work

Region Feature-Guided Automated Seed Selection Region Growing Method for Chip-Surface-Defect Detection

Year: 2024

Type: conference-paper

Source: International Conference on Video, Signal and Image Processing (VSIP)

DOI: 10.1145/3708568.3708577

Author: Wuyue Ma

Institution: South China Normal University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408023958

FWCI: 0.755

Cites: 6

Cited by: 1

Related to: 10