Evaluating microgrid controllers using an advanced hardware-in-the-loop testing chain integrated with digital twin technology
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Athanasios Vasilakis, Dimitrios Lagos, Ilias Katsambiris Grapsas, Nikos Hatziargyriou
Institution: National Technical University of Athens
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4408025343
