Error Modulation Scheme for Dual RINS Based on Device Time-Sequence Fusion
Year: 2025
Type: article
Source: IEEE Sensors Journal
Authors: Haoyu Bu, Feng Zha, Hongyang He, Chenyang Zhang, Quanchao Zhang
Institution: Naval University of Engineering
Language: English
Subfield: Aerospace Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G486636487
OpenAlex ID: W4408030037
