Research on dynamic parameter testing of 24-bit ADC based on V93000 test system
Year: 2025
Type: conference-paper
Abstract: To solve the problem that the built-in signal source of V93000 cannot provide excitation for 24-bit high-precision ADC in the low-frequency band, this paper proposes a method based on the joint test of V93000 and AP555, using the output of the high-precision AP555 audio analyzer as the test signal source, and using the V93000 LSI test bench of Advantest as the test equipment. It can effectively improve the measurement accuracy of ADC parameters. The test results show that the method based on the joint test of V93000 and AP555 can make up for the low accuracy of the built-in excitation signal source of V93000 at low frequency, and complete the test of dynamic parameters of 24-bit high-precision ADC.
Authors: Tao Ding, Zucheng Gu, Xiaojun Ma
Institutions: Chinese Academy of Sciences, Institute of Automation
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W4408039598