Work

Cumulative Degradation Modeling of Electrolytic Capacitors Considering Stress Interactions in Industrial Applications

Year: 2025

Type: article

Source: IEEE Transactions on Industrial Electronics

DOI: 10.1109/tie.2025.3544193

Authors: Qisen Sun, Cen Chen, Zicheng Wang, Xuerong Ye, Min Xie, Guofu Zhai

Institutions: Harbin Institute of Technology, City University of Hong Kong

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4408048318

FWCI: 2.311

Cites: 30

Cited by: 4

Related to: 10