Work

Mechanistic insights into the formation of phase pure V2O5 2D nanostructures: Advanced fourier transform-raman spectroscopy analysis

Year: 2025

Type: article

Abstract: Vanadium Pentoxide (V₂O₅) thin films and 2-Dimensional nanostructures have gained significant attention for their unique properties and diverse applications in gas sensing, energy storage, catalysis, and electrochromic devices. Despite their potential, a comprehensive understanding of their growth dynamics remains limited. This study offers a detailed exploration of the synthesis and properties of phase-pure V₂O₅ thin films and their nanostructures using a combination of solution combustion synthesis and spray pyrolysis deposition. The Aqueous Combustion Mixtures (ACM) were prepared using ammonium metavanadate and urea as precursor solutions, which were used to deposit V 2 O 5 using the spray pyrolysis technique at temperatures ranging from 200°C to 550°C. Advanced characterization techniques, including Field Emission Scanning Electron Microscopy, X-Ray Diffraction, and Fourier Transform Raman Spectroscopy, were employed to analyze the films. The results revealed that films synthesized at 400°C exhibited exceptional crystallinity, microstructural integrity, and phase purity. At higher temperatures, a meta-stable β-V₂O₅ phase was also observed. This research bridges a critical gap in the existing literature by enhancing the understanding of the growth mechanisms of V₂O₅ thin films and their nanostructures, thereby facilitating the optimized formation of high-quality V₂O₅ nanostructures for advanced technological applications.

Source: Thin Solid Films

DOI: 10.1016/j.tsf.2025.140642