Work

Migration of Chromium on the Silicon Oxide Surface under a Strong Electric Field

Year: 2024

Type: article

Source: Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques

DOI: 10.1134/s1027451024701179

Authors: I. V. Uvarov, L. A. Mazaletskiy

Institutions: Russian Academy of Sciences, Institute of Physics and Technology

Language: English

Topic: Advanced MEMS and NEMS Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408072664

FWCI:

Cites: 26

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Related to: 10