Work

Sputtering Yields for Single Crystal Samples of PbX (X = S, Se, Te) with Different Crystallographic Orientations

Year: 2024

Type: article

Source: Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques

DOI: 10.1134/s1027451024701210

Authors: S. P. Zimin, I. I. Amirov, L. A. Mazaletskiy, N. N. Kolesnikov, A. V. Timonina

Institutions: Russian Academy of Sciences, Yaroslavl State University, Institute of Physics and Technology, Osipyan Institute of Solid State Physics RAS

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408075901

FWCI:

Cites: 28

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Related to: 10