Work

Laser Decapsulation of Smd Product Enclosures Electronic Component Base

Year: 2024

Type: article

Source: Kontrol Diagnostika

DOI: 10.14489/td.2024.09.pp.046-057

Authors: L. A. Vasilyeva, M. I. Boychuk, N. A. Vasiliev, S. A. Mikaeva

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408081012

FWCI: 0.312

Cites: 3

Cited by: 3

Related to: 10