Work

Partial Discharge Detection of High Voltage Wide-bandgap Semiconductor Module Based on Common Mode Fault Current

Year: 2024

Type: conference-paper

Source: International Conference on Electrical Engineering and Control Technologies (CEECT)

DOI: 10.1109/ceect63656.2024.10899004

Authors: Penghao Zhang, Liang Yu, Xinzhu Yan, Shoulong Dong, Chenguo Yao

Institution: Chongqing University

Language: English

Topic: High voltage insulation and dielectric phenomena

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

OpenAlex ID: W4408092164

FWCI:

Cites:

Cited by:

Related to: 10