Work

Method for Mitigating Single Event Transients in Bandgap Reference Based on Dual Modular Redundancy

Year: 2024

Type: article

Source: Journal of Nanoelectronics and Optoelectronics

DOI: 10.1166/jno.2024.3694

Authors: Zhongjie Guo, Yapeng Wang, Yuan Ren

Institution: Xi'an University of Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408138204

FWCI:

Cites: 26

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Related to: 10