Work

A Comparative Analysis of Statistical Modeling and Machine Learning Techniques for Predicting the Lifetime of Light Emitting Diodes From Accelerated Life Testing

Year: 2025

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2025.3535849

Authors: Reem Alsharabi, Leen Almalki, Fidaa Abed, M. A. Majid, Omar A. Kittaneh

Institution: Effat University

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408145684

FWCI: 5.849

Cites: 21

Cited by: 10

Related to: 10