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Effects of Residual Stress on the Ferroelectric Properties of Al0.8Sc0.2N Films Sandwiched Between Pt or W Electrodes

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Year: 2025
Type: article
Source: IEEE Transactions on Electron Devices
DOI: 10.1109/ted.2025.3545391
Authors: Xiaoxi Li, Yuan Fang, Bochang Li, Jiuren Zhou, Zhifan Wu, Cizhe Fang, Xiangyu Zeng, Siying Zheng, Yue Hao, Yan Liu, Genquan Han
Institution: Xidian University
Language: English

Topic: Ferroelectric and Negative Capacitance Devices
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, China Postdoctoral Science Foundation, Fundamental Research Funds for the Central Universities
Awards: G1311738338, G4196760632, G441703290, G6081603033, G7968582096, G821947838, G8553384389
OpenAlex ID: W4408145694
FWCI: 2.079
Cites: 37
Cited by: 9
Related to: 10
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