Work

A VMD-Enhanced ELM Method for EVT Ratio Error Prediction

Year: 2024

Type: conference-paper

Source: International Conference on Intelligent Power and Systems (ICIPS)

DOI: 10.1109/icips64173.2024.10900302

Authors: Jiuxi Cui, Zhenhua Li, Feng Zhou, Yinglong Diao, Zhenxing Li, Yanchun Xu

Institutions: China Three Gorges University, China Electric Power Research Institute

Language: English

Topic: Advanced Electrical Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408146511

FWCI:

Cites: 15

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Related to: 10