Work

Advancing the reliability of wide bandgap semiconductors through in-situ transmission electron microscopy

Year: 2025

Type: article

Source: Scilight

DOI: 10.1063/10.0036189

Author: Ryan Nelson

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408152882

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Related to: 10