Thermal Annealing-Driven Modulation of Charge Trapping and Synaptic Plasticity in a Sol–Gel AlOx-Based Floating Gate Transistor
Year: 2025
Type: article
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Jeonbuk National University
OpenAlex ID: W4408160667
