Work

A Study on the Non-Linear Characteristics of Ohmic Contact Test Structures

Year: 2024

Type: conference-paper

Source: International Conference on Advanced Technologies for Communications

DOI: 10.1109/atc63255.2024.10908197

Authors: Thanh Pham Chi, Duy Nguyen Phuong, Anthony Holland

Institutions: RMIT Vietnam, RMIT University

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408199551

FWCI:

Cites: 27

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Related to: 10