Study of the GdK2Nb5O15 thin film by scanning probe microscopy and X-ray diffraction methods
Year: 2025
Type: article
Abstract: Ferroelectric thin films of GdK2Nb5O[Formula: see text] (GKN) are considered one of the new promising materials for computer memory systems. The electric potential of the GKN surface in the near vicinity of the burnt-in Pt electrode was measured using the Kelvin probe force microscopy (KPFM) method. The results are compared with the description of the metal-ferroelectric contact proposed by Pentile and Alexe (2005). Analysis of the contributions to the electric potential suggests a more complex charge distribution than suggested by the simple model.
Source: Journal of Advanced Dielectrics
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: diamond
Award: G838726062
OpenAlex ID: W4408200678