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A Study on Automated Wallpapering Defect Classification System Using ConvNeXt-based Ensemble Model

Year: 2025

Type: article

Source: The Journal of Next-generation Convergence Technology Association

DOI: 10.33097/jncta.2025.09.2.333

Authors: 숭실대학교 벤처중소기업학과 교수, Yong-Hee Han, Taeho Son

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4408207569

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